Microphone MEMS diaphragm and self-test thereof

ABSTRACT

A device includes a micro-electromechanical system (MEMS) element configured to sense acoustic signals. The device also includes a circuitry configured to enable the microphone element to sense the acoustic signals. The circuitry is further configured to disable the microphone element to prevent the microphone element to sense the acoustic signals. It is appreciated that the circuitry is further configured to apply a test signal to the MEMS element when the microphone element is disabled. The microphone element outputs a signal in response to the test signal to the circuitry. The circuitry in response to the output signal with a first value determines that a diaphragm of the MEMS element is nonoperational and the circuitry in response to the output signal with a second value determines that the diaphragm of the MEMS element is operational.

BACKGROUND

MEMS (“micro-electro-mechanical systems”) are a class of devices thatare fabricated using semiconductor-like processes and exhibit mechanicalcharacteristics. MEMS devices may include a membrane with the ability tomove or deform in response to a stimuli. A class of microphones utilizea MEMS element that deforms in response to acoustic waves (i.e. sound).The MEMS element may include a stationary plate and movable plate (i.e.a membrane that deforms in response to acoustic waves). The stationaryplate and the movable plate form a capacitor that changes capacitance asthe membrane deforms, responsive to acoustic waves. Common failures andperformance degradation result from damage to the membrane, e.g.,diaphragm, of the MEMS element. The diaphragm may be damaged or torn offas a result of acoustic overload, mechanical stress, and/orelectrostatic charge, resulting in partial or total loss of microphoneacoustic sensitivity.

Conventionally, the MEMS element and its functionality was testedexternally, e.g., by applying acoustic waves and if no response isregistered then it can be deduced that the membrane has been damaged ortorn off. Unfortunately, the device itself is incapable of testing thefunctionality and health of its membrane/diaphragm.

SUMMARY

Accordingly, a need has arisen for a device with a microphone to performa self-test to check whether its membrane (i.e. diaphragm) has beendamaged or torn off. According to some embodiments, a circuitry may beused to bias the diaphragm of the MEMS microphone by applying a charge,thereby enabling the diaphragm to deform responsive to acoustic waves.The circuitry may unbias the diaphragm of the MEMS microphone duringself-test, thereby disabling the diaphragm or reducing its sensitivityto acoustic waves. The circuitry may apply a test signal to the MEMSmicrophone once the MEMS microphone is unbiased such that itsubstantially responds to the test signal with minimal interference fromacoustic waves. The received output signal from the MEMS microphone isprocessed by the circuitry and if the signal has a first value (orrange) it is determined that the membrane (i.e. diaphragm) is notdamaged or torn off and if the signal has a second value (or range) itis determined that the diaphragm is damaged or torn off.

In some embodiments, a device includes a MEMS element configured tosense acoustic signals. The device also includes a circuitry configuredto enable the microphone element to sense the acoustic signals. Thecircuitry is further configured to disable the microphone element toprevent the microphone element to sense the acoustic signals. It isappreciated that the circuitry is further configured to apply a testsignal to the MEMS element when the microphone element is disabled. Themicrophone element outputs a signal in response to the test signal tothe circuitry. The circuitry in response to the output signal with afirst value determines that a diaphragm of the MEMS element isnonoperational and the circuitry in response to the output signal with asecond value determines that the diaphragm of the MEMS element isoperational.

It is appreciated that the test signal may be applied to the diaphragm,a backplate, and/or a handle element, of the MEMS element. The diaphragmand the backplate of the MEMS element form a capacitive element when thediaphragm is operational. The handle element is a carrier for a thinnersilicon device substrate.

In some embodiments, the circuitry may include a charge pump. The chargepump is configured to bias the MEMS element when the microphone elementis enabled. Moreover, the charge pump is configured to unbias the MEMSelement when the microphone element is disabled.

It is appreciated that the test signal may be programmable via thecircuitry. According to some embodiments, the diaphragm of the MEMSelement has a larger amplitude response to the test signal when thediaphragm of the MEMS element is nonoperational in comparison to whenthe diaphragm of the MEMS element is operational.

According to some embodiments, the device may further include aprocessing unit configured to initiate a self-test mode. The circuitrydisables the microphone element to prevent the microphone element tosense the acoustic waves when the processing unit initiates theself-test mode.

In some embodiments a method includes disabling a microphone element ofa MEMS element configured to sense acoustic waves. The method furtherincludes applying a test signal to the MEMS element of the microphoneelement. In some embodiments, the method further includes receiving anoutput signal from the MEMS element of the microphone element inresponse to the test signal. An amplitude response of the output signalis determined. The method further includes determining that a diaphragmof the MEMS element is nonoperational in response to the amplituderesponse of the output signal being greater than a threshold. Accordingto some nonlimiting examples, the method further includes determiningthat the diaphragm of the MEMS element is operational in response to theamplitude response of the output signal being lower than the threshold.

It is appreciated that the disabling may include terminating chargeapplication from a charge pump to the MEMS element. In some nonlimitingexamples, the applying includes applying the test signal to thediaphragm of the MEMS element. The diaphragm and a backplate of the MEMSelement form a capacitive element when the diaphragm is operational. Insome embodiments, the test signal may be applied to a backplate of theMEMS element. In some nonlimiting examples, the MEMS element includes ahandle element and the test signal is applied to the handle element. Itis appreciated that the handle element is a carrier for a thinnersilicon device substrate. It is appreciated that the test signal may beprogrammable. It is appreciated that the amplitude response of theamplitude signal in response to the test signal is larger when thediaphragm of the MEMS element is nonoperational in comparison to whenthe diaphragm of the MEMS element is operational. The method may furtherinclude receiving a signal initiating a self-test mode. The microphoneis disabled in response to the received signal to initiate the self-testmode.

These and other features and aspects of the concepts described hereinmay be better understood with reference to the following drawings,description, and appended claims.

BRIEF DESCRIPTION OF DRAWINGS

FIG. 1A shows a top perspective view of a packaged microphone having aMEMS microphone die according to one aspect of the present embodiments.

FIG. 1B shows a bottom perspective view of the packaged microphone inFIG. 1A.

FIG. 1C shows a cross-sectional view of the packaged microphone orientedas in FIG. 1A.

FIG. 1D shows a cross-sectional view of a similar packaged microphonehaving a bottom port according to one aspect of the present embodiments.

FIG. 2 shows a MEMS microphone die according to one aspect of thepresent embodiments.

FIG. 3 shows a device including a MEMS microphone with self-testcapability according to some embodiments.

FIG. 4 shows a MEMS element according to some embodiments.

FIG. 5 shows a circuitry initiating a self-test for the MEMS microphoneaccording to some embodiments.

FIG. 6 shows an analog front end circuitry applying a test signal duringself-test to a MEMS element according to some embodiments.

FIG. 7 shows a method of performing a self-test for the MEMS microphoneaccording to one aspect of the present embodiments.

DESCRIPTION

Before various embodiments are described in greater detail, it should beunderstood that the embodiments are not limiting, as elements in suchembodiments may vary. It should likewise be understood that a particularembodiment described and/or illustrated herein has elements which may bereadily separated from the particular embodiment and optionally combinedwith any of several other embodiments or substituted for elements in anyof several other embodiments described herein.

It should also be understood that the terminology used herein is for thepurpose of describing the certain concepts, and the terminology is notintended to be limiting. Unless defined otherwise, all technical andscientific terms used herein have the same meaning as commonlyunderstood in the art to which the embodiments pertain.

Unless indicated otherwise, ordinal numbers (e.g., first, second, third,etc.) are used to distinguish or identify different elements or steps ina group of elements or steps, and do not supply a serial or numericallimitation on the elements or steps of the embodiments thereof. Forexample, “first,” “second,” and “third” elements or steps need notnecessarily appear in that order, and the embodiments thereof need notnecessarily be limited to three elements or steps. It should also beunderstood that, unless indicated otherwise, any labels such as “left,”“right,” “front,” “back,” “top,” “middle,” “bottom,” “beside,”“forward,” “reverse,” “overlying,” “underlying,” “up,” “down,” or othersimilar terms such as “upper,” “lower,” “above,” “below,” “under,”“between,” “over,” “vertical,” “horizontal,” “proximal,” “distal,”“forming,” “formation,” “reducing,” “applying,” “pulling,” “bending,”“terminating,” “detecting,” “disabling,” “receiving,” determining,” andthe like are used for convenience and are not intended to imply, forexample, any particular fixed location, orientation, or direction.Instead, such labels are used to reflect, for example, relativelocation, orientation, or directions. It should also be understood thatthe singular forms of “a,” “an,” and “the” include plural referencesunless the context clearly dictates otherwise.

Terms such as “over,” “overlying,” “above,” “under,” etc. are understoodto refer to elements that may be in direct contact or may have otherelements in-between. For example, two layers may be in overlyingcontact, wherein one layer is over another layer and the two layersphysically contact. In another example, two layers may be separated byone or more layers, wherein a first layer is over a second layer and oneor more intermediate layers are between the first and second layers,such that the first and second layers do not physically contact.

A device having a microphone with a MEMS element that is capable ofperforming a self-test to check the health and operation of the membrane(i.e. diaphragm). In other words, the device may initiate a self-testautomatically or in response to a user selection. Once in self-testmode, it can be determined whether the diaphragm has been damaged ortorn off. According to some embodiments, the microphone may include aMEMS element having a backplate, a diaphragm, and a handle. The handletypically refers to a thicker substrate used as a carrier for thethinner silicon device substrate. The diaphragm is configured to deformin response to acoustic waves and together with the backplate(stationary plate) forms a capacitor. As such, the capacitive chargesstored changes as the diaphragm moves sensing acoustic waves.

A circuitry such as an application specific integrated circuit (ASIC)may be coupled to the MEMS element. The circuitry during normaloperation (i.e. not in self-test mode) biases, e.g., using a chargepump, the MEMS element (the diaphragm) such that the diaphragm is movedin response to acoustic waves. Once in self-test mode, the circuitryunbiases the diaphragm in order to reduce the sensitivity of thediaphragm to acoustic waves. In some embodiments, unbiasing thediaphragm disables the diaphragm from being responsive to acousticwaves.

In self-test mode, the circuitry applies a test signal to the MEMSelement, e.g., test signal applied to the diaphragm, test signal appliedto the handle, test signal applied to the backplate, or any combinationthereof. It is appreciated that the test signal may be programmable,e.g., the value of the test signal (e.g., amplitude, voltage) may changeor the shape of the injected signal (e.g., square wave, duty cycle,frequency, etc.) may change, etc. The MEMS element outputs a signal inresponse to the received test signal. The output signal may beassociated with the charges stored (i.e. voltage) on the capacitiveelement (i.e. backplate and the diaphragm). The circuitry receives andprocesses the output signal from the MEMS element. If the processedsignal is determined to have a first value (nominal value such as lessthan 10 mV) or range then it is determined that the diaphragm isoperational and not damaged and if the processed signal is determined tohave a second value (greater than 100 mV) or range then it is determinethat the diaphragm is nonoperational. In other words, when the diaphragmis damaged or torn off, a high amplitude levels are experienced when atest signal is applied while lower amplitude levels are experienced whena test signal is applied and when the diaphragm is undamaged.

It is appreciated that the term acoustic waves has been usedinterchangeably with acoustic/audio signals. It is also appreciated thatthe term membrane has been used interchangeably with diaphragmthroughout this application. FIGS. 1A-1D and 2 are directed to generaldiscussions regarding a MEMS element in a microphone while FIGS. 3-7describe the architectural and process steps of self-test to determinewhether a diaphragm of the MEMS element is damaged or torn off.

FIG. 1A shows a top perspective view of a packaged microphone 10 havinga MEMS microphone die 16 (shown in FIGS. 1C, 1D, and 2) according to oneaspect of the present embodiments.

The packaged microphone 10 shown has a package base 12 that, togetherwith a corresponding lid 14, forms an interior chamber containing amicrophone chip 16 and, if desired, a separate microphone circuit chip18 (both dies 16 and 18 are shown schematically in FIGS. 1C and 1D anddiscussed below). The lid 14 in this embodiment is a cavity-type lid,which has four walls extending generally orthogonally from a top,interior face to form a cavity. In illustrative embodiments, the lid 14is formed from metal or other conductive material to shield themicrophone die 16 from electromagnetic interference. The lid 14 securesto the top face of the substantially flat package base 12 to form theinterior chamber.

The lid 14 also has an audio input port 20 that enables ingress ofacoustic waves (i.e. audio signals) into the chamber. In alternativeembodiments, however, the audio port 20 is at another location, such asthrough the package base 12, or through one of the side walls of the lid14. Audio signals entering the interior chamber interact with themicrophone chip 16 to produce an electrical signal that, with additional(exterior) components (e.g., a speaker and accompanying circuitry),produce an output audible signal corresponding to the input audiblesignal.

FIG. 1B shows a bottom face 22 perspective view of the packagedmicrophone in FIG. 1A. The bottom face 22 of the package base 12, has anumber of contacts 24 for electrically (and physically, in manyanticipated uses) connecting the microphone die 16 with a substrate,such as a printed circuit board or other electrical interconnectapparatus. The packaged microphone 10 may be used in any of a widevariety of applications. For example, the packaged microphone 10 may beused with mobile telephones, land-line telephones, computer devices,video games, hearing aids, hearing instruments, biometric securitysystems, two-way radios, public announcement systems, and other devicesthat transduce signals. In fact, it is anticipated that the packagedmicrophone 10 could be used as a speaker to produce audible signals fromelectronic signals.

In illustrative embodiments, the package base 12 may be a printedcircuit board material, such as FR-4, or a pre-molded, leadframe-typepackage (also referred to as a “pre-molded package”). Other embodimentsmay use different package types, such as ceramic cavity packages.Accordingly, discussion of a specific type of package is forillustrative purposes only.

FIG. 1C shows a cross-sectional view of the packaged microphone 10oriented across line C-C of FIG. 1A. As shown and noted above, the lid14 and base 12 form the noted internal chamber for containing a MEMSmicrophone die 16 and electronics 18 used to control and drive themicrophone die 16. In illustrative embodiments, electronics areimplemented as a second, stand-alone integrated circuit, such as anapplication specific integrated circuit (“ASIC 18”). Other embodiments,however, may form the MEMS microstructure and electronic circuitry on asingle die.

Adhesive or another fastening mechanism secures both the microphone die16 and ASIC die 18 to the base 12. Wire bonds electrically connect themicrophone die 16 and ASIC die 18 to contact pads (not shown) on theinterior of the package base 12.

While a top port packaged microphone design has been illustrated, someembodiments position the input port at other locations, such as throughthe base 12. For example, FIG. 1D schematically shows a cross-sectionalview of a similar packaged microphone 10 where the microphone die 16covers the input port, consequently producing a large back volume. Otherembodiments, not shown, position the microphone die 16 so that it doesnot cover the input port 20 through the base 12. Discussion of aspecific packaged microphone is for illustrative purposes only.Accordingly, the packaged microphone 10 discussed with regard to FIGS.1A-1D are not intended to limit all embodiments of the invention.

FIG. 2 shows a MEMS microphone die 16 (also referred to as a “microphonechip”) according to one aspect of the present embodiments. Among otherthings, the microphone die 16 includes a stationary portion 26 thatsupports and forms a variable capacitor 28 with a flexible diaphragm 30.

In illustrative embodiments, the stationary portion 26 includes abackplate 32 (shown in subsequent figures and discussed below) formedfrom single crystal silicon (e.g., the top layer of asilicon-on-insulator wafer, discussed below) and other deposited layers,while the diaphragm 30 is formed from a deposited material only, such asdeposited polysilicon. Other embodiments, however, use other types ofmaterials to form the stationary portion 26 and the diaphragm 30. Forexample, a single crystal silicon bulk wafer, and/or some depositedmaterial, may form the stationary portion 26. In a similar manner, asingle crystal silicon bulk wafer, part of a silicon-on-insulator wafer,or some other deposited material may form the diaphragm 30. It isappreciated that the stationary portion 26 of the microphone die 16 hasa backplate 32 that, together with the diaphragm 30, may form a variablecapacitor. The diaphragm 30 deforms in response to acoustic waves,causing the variable capacitor to change capacitive charges storedthereon.

Springs 34 movably and integrally connect the outer periphery of thediaphragm 30 to the stationary portion 26 of the microphone die 16. Thesprings 34 effectively form a plurality of apertures 36 that permit atleast a portion of the audio/acoustic signal to pass through thediaphragm 30. These apertures 36, which also may be referred to as“diaphragm apertures 36,” may be any shape as required by theapplication, such as in the shape of a slot, round hole, or someirregular shape. Electrical contacts 25 on the top face of the dies 16and 18 provide electrical connection for the wire bonds shown in FIGS.1C and 1D.

FIG. 3 shows a device including a MEMS microphone with self-testcapability according to some embodiments. A microphone element 310 mayinclude a MEMS element 320, e.g., backplate, diaphragm, and handle. Thediaphragm of the MEMS element 320 may deform in response to sound 302(also referred to as acoustic waves). The MEMS element 320 outputssignal 322 in response the diaphragm moving. The circuitry 330 receivesand processes the acoustic analog signal 322 to generate acoustic signalsuch as output signal 332.

According to some embodiments, the circuitry 330 may initiate aself-test mode to test the health of the diaphragm of the MEMSelement320. It is appreciated that the self-test may be initiatedautomatically or in response to a user selection thereof. In self-testmode, the circuitry 330 unbias the diaphragm of the MEMS element 320 (orlower the MEMS bias voltage) in order to reduce its sensitivity toacoustic waves (or to disable its response to acoustic waves). In otherwords, interference from acoustic waves is reduced.

Once unbiased, the diaphragm of the MEMS element 320 becomessubstantially insensitive to the acoustic wave 302. The circuitry 330may transmit a test signal 332 to the MEMS element 320. The test signal332 may be programmable. For example, the amplitude of the test signal332 may change, the duty cycle may be adjusted, the frequency may bemodified, the shape may be adjusted (e.g., square wave as opposed to asinusoidal wave), etc. The test signal 332 may be applied to one or morelocation of the MEMS element 320. For example, referring now to FIG. 4shows a MEMS element 320 according to some embodiments. In thisnonlimiting example, the MEMS element 320 may include a backplate 410, adiaphragm 420, and a handle 430. As discussed above, the handle 430wafer typically refers to a thicker substrate used as a carrier for thethinner silicon device substrate, e.g., diaphragm 420. The diaphragm 420and the backplate 410 form a capacitor. The diaphragm 420 moves anddeforms in response to a stimuli, e.g., sound 302, test signal 332, etc.Referring back to FIG. 3, the test signal 332 may be applied to thebackplate 410, the diaphragm 420, and/or the handle 430. The MEMSelement 320 outputs signal 322 in response to the test signal 332.

The circuitry 330 receives the output signal 322 and processes it, e.g.,amplified, lowpass/bandpass filter, etc. Once processed, the circuitry330 may determine whether the diaphragm 420 of the MEMS element 320 isdamaged. In general, a higher amplitude response from the MEMS element320 is associated with damaged diaphragm 420 whereas a lower amplitudeis associated with undamaged diaphragm 420. As such, in some embodimentsthe output signal 322 processed as having an amplitude less than 10 mVmay be associated with undamaged diaphragm 420 and one having anamplitude greater than 100 mV may be associated with damaged diaphragm420. Accordingly, the circuitry 330 may output 332 signal, e.g., abinary value, indicating whether the diaphragm 420 is damaged orundamaged. In operational and not in self-test mode the output signal332 may be the output acoustic analog signal as detected by themicrophone element 310.

Referring now to FIG. 5, a circuitry 330 initiating a self-test for theMEMS microphone according to some embodiments is shown. In thisnonlimiting example, the circuitry 330 may include a charge pump 510, ananalog front end 520 unit, a signal processing 530 unit, and a sampleand average 540 unit. As discussed above, during operational mode (i.e.not in self-test mode), the MEMS element 320 of the microphone is biasedin order to increase its sensitivity to acoustic waves. As such, thecharge pump 510 may apply charges to the MEMS element 320 in order tobias the MEMS element 320. The sensed acoustic signals by the MEMSelement 320 is acoustic analog signal 322 as received by the analogfront end 520 unit. The acoustic analog signal 322 is processed by thesignal processing 530 unit and subsequently sampled and averaged by thesample and average 540 unit to generate the output signal 332 (i.e.audio output).

In self-test mode, a processor (not shown) may send a notificationsignal to the microphone element 310 that the device is entering aself-test mode. In self-test mode, the MEMS element 320 is unbiased toreduce its sensitivity to acoustic waves. As such, the charge pump 510does not apply charges to the MEMS element 320 once in self-test mode.The analog front end 520 may apply a test signal 332 (as describedabove) to the MEMS element 320. The test signal 332 may be applied toone or more locations of the MEMS element 320, e.g., backplate 410,diaphragm 420, and/or handle 430, therefore creating a voltage acrossthe capacitive element (if the diaphragm 420 is undamaged). In responseto the test signal 332, the MEMS element 320 generates an acousticanalog signal 322. The acoustic analog signal 322 is received by theanalog front end 520 unit. In some nonlimiting examples, the analogfront end 520 may include a filter, e.g., low pass filter, bandpassfilter, etc. The filtered signal may be inversely proportional to thecapacitance of the capacitive element when in self-test mode. As such, asmall amplitude is generated as the acoustic output signal 522 when thecapacitive element (i.e. backplate 410 and diaphragm 420) is undamaged.Conversely, a large amplitude is generated as the acoustic output signal522 when the capacitive element is damaged.

In some embodiments, the acoustic output signal 522 is processed by thesignal processing 530 unit as well as being sampled and averaged by thesample and average 540 unit. It is appreciated that the signalprocessing 530 unit and the sample and average 540 unit may beintegrated within the analog front end 520 is some nonlimiting examples.It is appreciated that the sample and average 540 unit may be used tomake the determination of whether the diaphragm 420 is damaged orundamaged statistically significant. Moreover, it is appreciated thatthe signal processing unit 530 and/or the sample and average 540 unitmay be used to convert the analog signal(s) to digital signal(s).

The signal processing 530 unit may determine whether the diaphragm 420of the MEMS 320 element is undamaged based on the amplitude. Forexample, for amplitudes less than 10 mV it may be determined that thediaphragm 420 is undamaged, and for amplitudes greater than 100 mV itmay be determined that the diaphragm 420 is damaged. According to someembodiments, the test signal 332 may be a plurality of signals injectedin a particular frequency. As such, a determination (i.e. pass/fail ofthe diaphragm 420) may be made for each test signal and sampled andaveraged in order to make the determination of pass/fail in a morestatistically significant fashion. It is appreciated that in someembodiments, the output signal of the signal processing 530 unit may besampled and averaged by the sample and average 530 unit over severalperiods of test signal 332. The sampled and averaged value may becompared to a first threshold value (e.g., less than 10 mV) to determinethat the diaphragm 420 is undamaged and comparing it to a secondthreshold value (e.g., greater than 100 mV, greater than 10 mV, etc.) todetermine that the diaphragm 420 is damaged. The output signal 332 inself-test mode is a determination of whether the diaphragm 420 isdamaged or undamaged. It is appreciated that the threshold values may bedigitally programmable thresholds.

Referring now to FIG. 6, an analog front end circuitry applies a testsignal during self-test to a MEMS element according to some embodiments.The analog front end 520 may include switches 632, 634, and 636 tooperatively couple the test signal 332 to the desired element of theMEMS 320 element. For example, when the switch 632 is turned on duringself-test mode, the test signal 332 is applied to the diaphragm 420.Similarly, when the switch 634 is turned on during self-test mode, thetest signal 332 is applied to the handle 430. In some nonlimitingexamples, when the switch 636 is turned on during self-test mode, thetest signal 332 is applied to the backplate 410. It is appreciated thatmore than one switch may be turned on at the same time, e.g., testsignal 332 may be applied to both the diaphragm 420 and the backplate410 if the switches 632 and 636 are turned on at the same time. It isappreciated that the embodiments are described above with respect to adifferential signal output. However, it is appreciated that theembodiments should not be construed as limited thereto. For example, asingle ended signal may be used. It is appreciated that the diaphragmand the backplate of the MEMS element forms a capacitive element whenthe diaphragm is operational. It is appreciated that in someembodiments, the test signal may be applied to the diaphragm of the MEMSelement. In some nonlimiting examples, the test signal may be applied tothe backplate of the MEMS element. In yet another nonlimiting example,the test signal may be applied to the handle (i.e. carrier for a thinnersilicon device substrate) element of the MEMS. It is appreciated thatthe test signal may have a shape, a frequency and an amplitude. Forexample, the test signal may be a square wave, a triangular wave, or asinusoidal wave with a frequency ranging between 10 Hz to 10 MHz and anamplitude between 10 mVpeak to 10 Vpeak.

FIG. 7 shows a method of performing a self-test for the MEMS microphoneaccording to one aspect of the present embodiments. At step 710,optionally, a signal initiating a self-test mode may be received, e.g.,from a processor, initiated by the user, etc. At step 720, themicrophone element configured to sense acoustic waves may be disabled.In other words, the sensitivity of the MEMS 320 element to acousticwaves may be reduced, e.g., by unbiasing the MEMS 320 element. At step730, a test signal is applied to the MEMS element of the microphoneelement. In response to the test signal, an output signal is receivedfrom the MEMS element of the microphone element at step 740. At step750, an amplitude response of the output signal is determined. At step760, it is determined that the diaphragm of the MEMS element isnonoperational in response to the amplitude response of the outputsignal being greater than a first threshold value. At step 770, it isdetermined that the diaphragm of the MEMS element is operational inresponse to the amplitude response of the output signal being less thana second threshold value.

While the embodiments have been described and/or illustrated by means ofparticular examples, and while these embodiments and/or examples havebeen described in considerable detail, it is not the intention of theApplicants to restrict or in any way limit the scope of the embodimentsto such detail. Additional adaptations and/or modifications of theembodiments may readily appear, and, in its broader aspects, theembodiments may encompass these adaptations and/or modifications.Accordingly, departures may be made from the foregoing embodimentsand/or examples without departing from the scope of the conceptsdescribed herein. The implementations described above, and otherimplementations are within the scope of the following claims.

What is claimed is:
 1. A device comprising: a microphone elementcomprising a micro-electromechanical system (MEMS) element configured tosense acoustic waves; and a circuitry configured to enable themicrophone element to sense the acoustic waves and the circuitry isfurther configured to disable the microphone element to prevent themicrophone element to sense the acoustic waves, and wherein thecircuitry is further configured to apply a test signal to the MEMSelement when the microphone element is disabled, wherein the microphoneelement outputs a signal in response to the test signal to thecircuitry, and wherein the circuitry in response to the output signalgreater than a first threshold value determines that a diaphragm of theMEMS element is nonoperational and wherein the circuitry in response tothe output signal less than a second threshold value determines that thediaphragm of the MEMS element is operational.
 2. The device of claim 1,wherein the test signal is applied to the diaphragm of the MEMS element,wherein the diaphragm and a backplate of the MEMS element form acapacitive element when the diaphragm is operational.
 3. The device ofclaim 1, wherein the test signal is applied to a backplate of the MEMSelement, wherein the diaphragm and the backplate of the MEMS elementform a capacitive element when the diaphragm is operational.
 4. Thedevice of claim 1, wherein the MEMS element includes a handle elementand wherein the test signal is applied to the handle element, andwherein the handle element is a carrier for a thinner silicon devicesubstrate.
 5. The device of claim 1, wherein the circuitry furtherincludes a charge pump and wherein the charge pump is configured to biasthe MEMS element when the microphone element is enabled, and wherein thecharge pump is configured to unbias the MEMS element when the microphoneelement is disabled.
 6. The device of claim 1, wherein the test signalis programmable via the circuitry.
 7. The device of claim 1, wherein thetest signal is a square wave with a frequency ranging between 10 Hz to10 MHz and an amplitude between 10 mVpeak to 10 Vpeak.
 8. The device ofclaim 1, wherein the diaphragm of the MEMS element has a largeramplitude response to the test signal when the diaphragm of the MEMSelement is nonoperational in comparison to when the diaphragm of theMEMS element is operational.
 9. The device of claim 1 further comprisinga processing unit configured to initiate a self-test mode, wherein thecircuitry disables the microphone element to prevent the microphoneelement to sense the acoustic waves when the processing unit initiatesthe self-test mode.
 10. A method comprising: disabling a microphoneelement of a micro-electromechanical system (MEMS) element configured tosense acoustic waves; applying a test signal to the MEMS element of themicrophone element; receiving an output signal from the MEMS element ofthe microphone element in response to the test signal; determining anamplitude response of the output signal; and determining that adiaphragm of the MEMS element is nonoperational in response to theamplitude response of the output signal being greater than a firstthreshold value.
 11. The method of claim 10, wherein the applyingincludes applying the test signal to the diaphragm of the MEMS element,wherein the diaphragm and a backplate of the MEMS element form acapacitive element when the diaphragm is operational.
 12. The method ofclaim 10, wherein the test signal is applied to a backplate of the MEMSelement, wherein the diaphragm and the backplate of the MEMS elementform a capacitive element when the diaphragm is operational.
 13. Themethod of claim 10, wherein the MEMS element includes a handle elementand wherein the test signal is applied to the handle element, andwherein the handle element is a carrier for a thinner silicon devicesubstrate.
 14. The method of claim 10, wherein the test signal isprogrammable.
 15. The method of claim 10, wherein the amplitude responseof the amplitude signal in response to the test signal is larger whenthe diaphragm of the MEMS element is nonoperational in comparison towhen the diaphragm of the MEMS element is operational.
 16. The method ofclaim 10 further comprising receiving a signal initiating a self-testmode, wherein the microphone is disabled in response to the receivedsignal to initiate the self-test mode.
 17. The method of claim 10further comprising determining that the diaphragm of the MEMS element isoperational in response to the amplitude response of the output signalbeing lower than a second threshold value.
 18. The method of claim 10,wherein the test signal is a sinusoidal wave with a frequency rangingbetween 10 Hz to 10 MHz and an amplitude between 10 mVpeak to 10 Vpeak.19. A device comprising: a microphone element comprising amicro-electromechanical system (MEMS) element configured to senseacoustic waves; and a circuitry configured to enable the microphoneelement to sense the acoustic waves and the circuitry is furtherconfigured to disable the microphone element to prevent the microphoneelement to sense the acoustic waves when in self-test mode, wherein thecircuitry comprises a plurality of switches configured to apply a testsignal to a plurality of test positions of the MEMS element when themicrophone element is disabled, wherein the microphone element outputs asignal in response to the test signal to the circuitry, and wherein thecircuitry in response to the output signal with a first value determinesthat a diaphragm of the MEMS element is nonoperational and wherein thecircuitry in response to the output signal with a second valuedetermines that the diaphragm of the MEMS element is operational. 20.The device of claim 19, wherein the plurality of test positions includesthe diaphragm of the MEMS element, a backplate of the MEMS element thatforms a capacitive element when the diaphragm is operational, and ahandle element and wherein the test signal is applied to the handleelement, and wherein the handle element is a carrier for a thinnersilicon device substrate.
 21. The device of claim 19, wherein the testsignal is programmable.
 22. The device of claim 19, wherein the testsignal is a triangular wave with a frequency ranging between 10 Hz to 10MHz and an amplitude between 10 mVpeak to 10 Vpeak.